2nd ToF-SIMS LEIS Workshop and LEIS User Meeting
| location: | Department of Materials, Imperial College London (map) |
| date: | Thursday the 19th and Friday the 20th of April, 2012. |
| aim: | To continue bringing researchers together from a wide range of materials backgrounds and disciplines, and highlight how these techniques can be successfully applied to solve many materials’ problems. |
| day 1: |
Workshop |
| A series of presentations given by invited speakers who are experts in the application of SIMS and ion scattering. | |
| Workshop Program | |
| day 2: |
LEIS User’s Meeting |
| A day dedicated to researchers who use or are interested in using LEIS. The day will consist of a mix of invited speakers and researchers presenting current data. The aim of the day will be to openly discuss successes, problems and pitfalls related to carrying out LEIS analyses on a wide range of materials. | |
| Users Meeting Program | |
| fee: | £30 (free for PhD students) Registration closes on March 31st |
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